James R. Schwank, Marty R. Shaneyfelt, et al.
RADECS 2009
Paper
An evaluation of an ultralow background alpha-particle detector
Abstract
XIA has provided IBM with a prototype ultralow background alpha particle counter for evaluation. Results show a significant decrease in background compared to other commercial counters allowing for rapid measurement of low-emissivity materials. © 2009 IEEE.
Related
Michael S. Gordon, Ken Rodbell, et al.
Semiconductor Science and Technology
Martha V. O'Bryan, Kenneth A. LaBel, et al.
REDW/NSREC 2011
Kenneth P. Rodbell, David F. Heidel, et al.
IEEE TNS