David F. Heidel, Kenneth P. Rodbell, et al.
IEEE TNS
The emitted alpha particle energy distribution from solder bumps can show substantial surface emission which has a large impact on the modeled SEU rate. State-of-the art alpha-particle detectors are required to measure the low emissivity and energy distribution. © 2010 IEEE.
David F. Heidel, Kenneth P. Rodbell, et al.
IEEE TNS
Ethan H. Cannon, Michael S. Gordon, et al.
IRPS 2008
Ken Rodbell, Michael S. Gordon, et al.
IEEE TNS
Subhasish Mitra, Pradip Bose, et al.
VLSI-TSA 2014