Nathaniel A. Dodds, James R. Schwank, et al.
IEEE TNS
The emitted alpha particle energy distribution from solder bumps can show substantial surface emission which has a large impact on the modeled SEU rate. State-of-the art alpha-particle detectors are required to measure the low emissivity and energy distribution. © 2010 IEEE.
Nathaniel A. Dodds, James R. Schwank, et al.
IEEE TNS
Brendan D. McNally, Stuart Coleman, et al.
Nucl. Instrum. Methods Phys. Res
Jonathan A. Pellish, Michael A. Xapsos, et al.
IEEE TNS
Michael S. Gordon, Kenneth P. Rodbell, et al.
IEEE TNS