Experimental 27 ns 1 Mb CMOS high-speed DRAM
S. Dhong, W.H. Henkels, et al.
VLSI Circuits 1989
This paper presents a pulsed sensing scheme with a limited BitLine swing designed for 4-Mb CMOS high-speed DRAM’s (HSDRAM’s) and beyond. It uses a standard CMOS cross-coupled sense amplifier and limits the swing by means of a pulsed sense clock. The signal loss that would occur if the bitline swing was not exactly limited to one threshold above the word-line’s low level is avoided by using a small reference voltage generator and trench decoupling capacitors. The new sensing scheme was successfully implemented on an experimental HSDRAM fabricated by using 0.7-μ LCMOS technology, and thus a high-speed random access time of 15 ns and a low power dissipation of 144 mW were obtained for 512-kb array activation with a fast cycle time of 60 ns at 3.6 V. © 1992 IEEE
S. Dhong, W.H. Henkels, et al.
VLSI Circuits 1989
Y. Katayama, A. Okazaki
HPCA 2007
S.S.P. Parkin, K.P. Roche, et al.
Journal of Applied Physics
Y. Katayama, C. Haymes, et al.
CCNC 2007