Publications

44 results at Microelectronics Reliability

Mapping and statistical analysis of filaments locations in amorphous HfO₂ ReRAM cells
- - Franco Stellari
  - Ernest Y. Wu
  - et al.
- 2023
- Microelectronics Reliability
Controversial issues in negative bias temperature instability
- - James H. Stathis
  - Souvik Mahapatra
  - et al.
- 2018
- Microelectronics Reliability
Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges
- - F. Chen
  - Carole Graas
  - et al.
- 2015
- Microelectronics Reliability
Long-term NBTI degradation under real-use conditions in IBM microprocessors
- - Pong-Fei Lu
  - Keith A. Jenkins
  - et al.
- 2014
- Microelectronics Reliability
Electromigration challenges for advanced on-chip Cu interconnects
- - Baozhen Li
  - Cathryn Christiansen
  - et al.
- 2014
- Microelectronics Reliability
On-chip circuit to monitor long-term NBTI and PBTI degradation
- - Keith A. Jenkins
  - Pong-Fei Lu
- 2013
- Microelectronics Reliability
Including spatial correlations of channel length and threshold voltage variation in circuit simulations
- - Josef Watts
  - Henry Trombley
- 2012
- Microelectronics Reliability
Thermal fracture toughness measurement for underfill during temperature change
- - Soojae Park
  - Claudius Feger
- 2011
- Microelectronics Reliability
Reliability of advanced high-k/metal-gate n-FET devices
- - J.H. Stathis
  - M. Wang
  - et al.
- 2010
- Microelectronics Reliability
Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability
- - Aditya Bansal
  - Rahul Rao
  - et al.
- 2009
- Microelectronics Reliability