Publications

14 results at IRPS 2011

Invasion percolation model for abnormal TDDB characteristic of ULK dielectrics with Cu interconnect at advanced technology nodes
- - F. Chen
  - Michael Shinosky
  - et al.
- 2011
- IRPS 2011
Fast characterization of the Static Noise Margin degradation of cross-coupled inverters and correlation to BTI instabilities in MG/HK devices
- - Andreas Kerber
  - N. Pimparkar
  - et al.
- 2011
- IRPS 2011
Correlation of I_d- and I_g-random telegraph noise to positive bias temperature instability in scaled high-κ/metal gate n-type MOSFETs
- - Chia-Yu Chen
  - Qiushi Ran
  - et al.
- 2011
- IRPS 2011
PBTI under dynamic stress: From a single defect point of view
- - K. Zhao
  - J.H. Stathis
  - et al.
- 2011
- IRPS 2011
A robust reliability methodology for accurately predicting Bias Temperature Instability induced circuit performance degradation in HKMG CMOS
- - D.P. Ioannou
  - K. Zhao
  - et al.
- 2011
- IRPS 2011
Impact of HK / MG stacks and future device scaling on RTN
- - Naoki Tega
  - Hiroshi Miki
  - et al.
- 2011
- IRPS 2011
Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- - Jae-Joon Kim
  - Barry P. Linder
  - et al.
- 2011
- IRPS 2011
Bias Temperature Instability model for digital circuits - Predicting instantaneous FET response
- - Aditya Bansal
  - Kai Zhao
  - et al.
- 2011
- IRPS 2011
Spectral resolution of photon emission from SiGe:C heterojunction bipolar transistors (HBTs)
- - Ulrike Kindereit
  - Oana-Mihaela Mutihac
  - et al.
- 2011
- IRPS 2011
Analysis of recoverable and non-recoverable NBTI and PBTI using AC and DC stresses
- - Frederic Monsieur
  - Eduard Cartier
  - et al.
- 2011
- IRPS 2011