Publications

5 results at IRPS 2020

Analysis of BTI, SHE Induced BTI and HCD under Full V_G/V_D Space in GAA Nano-Sheet N and P FETs
- - Nilotpal Choudhury
  - Uma Sharma
  - et al.
- 2020
- IRPS 2020
Conference paper
Open Block Characterization and Read Voltage Calibration of 3D QLC NAND Flash
- - Nikolaos Papandreou
  - Haralampos Pozidis
  - et al.
- 2020
- IRPS 2020
Conference paper
Neuromorphic Computing with Phase Change, Device Reliability, and Variability Challenges
- - Charles Mackin
  - Pritish Narayanan
  - et al.
- 2020
- IRPS 2020
Conference paper
A new technique for evaluating stacked nanosheet inner spacer TDDB reliability
- - Tian Shen
  - K. Watanabe
  - et al.
- 2020
- IRPS 2020
Conference paper
NBTI Impact of Surface Orientation in Stacked Gate-All-Around Nanosheet Transistor
- - Huimei Zhou
  - Miaomiao Wang
  - et al.
- 2020
- IRPS 2020
Conference paper