Losses caused by roughness of metallization in printed-circuit boards
- A. Deutsch
- C. Surovic
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Conference paper
Publications
12 results at IEEE Topical Meeting EPEPS 2005
The general variational formulas for capacitance parameter extraction
- W.C. Chew
- L.J. Jiangt
- 2005
- IEEE Topical Meeting EPEPS 2005
Conference paperComplex power distribution network investigation using SPICE based extraction from first principle formulations
- Giuseppe Selli
- James L. Drewniak
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Conference paperUsing S-parameters successfully in time domain link simulations
- Dierk Kaller
- Christian Schuster
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Conference paperWaveform relaxation techniques for simulation of coupled interconnects with frequency-dependent parameters
- Natalie Nakhla
- Albert Ruehli
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Conference paperSolving low frequency EM-CKT problems using the PEEC method
- Dipanjan Gope
- Albert Ruehli
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Conference paperElectrical / optical high speed scalability link implementation
- D. Kuchta
- C. Baks
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Conference paperUnderstanding how to model difficult features and related physical effects in electrical packages
- Barry J. Rubin
- 2005
- IEEE Topical Meeting EPEPS 2005
Conference paperThe effect of power islands on delta-I noise, interconnect noise, and timing for wide, on-chip data-buses
- A. Deutsch
- H. Smith
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Conference paperThe use of accelerated full-wave modeling to analyze power island coupling in a HyperBGA SCM
- J.D. Morsey
- A. Deutsch
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Conference paper