Publications

12 results at ECS Meeting 2005

Reactive diffusion in the Ni-Si system: Influence of Ni thickness on the phase formation sequence
- - C. Coïa
  - C. Lavoie
  - et al.
- 2005
- ECS Meeting 2005
Electron mobility dependence of W/HFO ₂ gate stacks on interfacial layer preparation
- - A.C. Callegari
  - P. Jamison
  - et al.
- 2005
- ECS Meeting 2005
Characterization of ultra thin SOI and SSOI substrates: Defect and strain analysis
- - S.W. Bedell
  - H.J. Hovel
  - et al.
- 2005
- ECS Meeting 2005
Germanium-on-Si MOSFETS with HFO ₂ gate dielectric
- - J.P. Donnelly
  - J. Chen
  - et al.
- 2005
- ECS Meeting 2005
High performance SOI device options
- - Shih-Fen Huang
- 2005
- ECS Meeting 2005
Strain engineering for silicon CMOS technology
- - D.K. Sadana
  - S.W. Bedell
  - et al.
- 2005
- ECS Meeting 2005
Effect of surface nitridation on the Ge/HfO₂ interface
- - R. Garg
  - D. Misra
  - et al.
- 2005
- ECS Meeting 2005
Materials interaction at the nanoscale in high-k metal gate stacks: The role of oxygen
- - S. Guha
  - E.J. Preisler
  - et al.
- 2005
- ECS Meeting 2005
A study of negative bias temperature instability (NBTI) in pFETs
- - Sufi Zafar
  - James Stathis
  - et al.
- 2005
- ECS Meeting 2005
Metal-organic atomic layer deposition of metals for applications in interconnect technology
- - O. Van Der Straten
  - S.M. Rossnagel
  - et al.
- 2005
- ECS Meeting 2005