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- IEEE Transactions on Electron Devices
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139 results at IEEE Transactions on Electron Devices
Improved hot-carrier reliability of SOI transistors by deuterium passivation of defects at oxide/silicon interfaces
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- IEEE Transactions on Electron Devices
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- IEEE Transactions on Electron Devices
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- IEEE Transactions on Electron Devices
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- IEEE Transactions on Electron Devices
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- IEEE Transactions on Electron Devices
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- IEEE Transactions on Electron Devices
PaperHigh-performance bottom electrode organic thin-film transistors
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- IEEE Transactions on Electron Devices
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- IEEE Transactions on Electron Devices
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- IEEE Transactions on Electron Devices
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