Publications

465 results at IEEE T-ED

Modeling and characterization of gate leakage in high-K metal gate technology-Based embedded DRAM
- - Mohit Bajaj
  - Rajan K. Pandey
  - et al.
- 2013
- IEEE T-ED
Ab initio study of metal grain orientation-dependent work function and its impact on FinFET variability
- - Samarth Agarwal
  - Rajan Kumar Pandey
  - et al.
- 2013
- IEEE T-ED
Compact model for carbon nanotube field-effect transistors including nonidealities and calibrated with experimental data down to 9-nm gate length
- - Jieying Luo
  - Lan Wei
  - et al.
- 2013
- IEEE T-ED
Meeting the challenge of multiple threshold voltages in highly scaled undoped FinFETs
- - Ramachandran Muralidhar
  - Jin Cai
  - et al.
- 2013
- IEEE T-ED
Electrical resistivity of liquid Ge₂Sb₂Te₅ based on thin-film and nanoscale device measurements
- - Kadir Cil
  - Faruk Dirisaglik
  - et al.
- 2013
- IEEE T-ED
Specifications of nanoscale devices and circuits for neuromorphic computational systems
- - Bipin Rajendran
  - Yong Liu
  - et al.
- 2013
- IEEE T-ED
Contact-induced negative differential resistance in short-channel graphene FETs
- - Roberto Grassi
  - Tony Low
  - et al.
- 2013
- IEEE T-ED
Corrections to "on the ballistic injection velocity in deeply scaled MOSFETs"
- - Yang Liu
  - Mathieu Luisier
  - et al.
- 2012
- IEEE T-ED
Probing the interface barriers of dopant-segregated silicide-Si diodes with internal photoemission
- - Zhen Zhang
  - Joanna Atkin
  - et al.
- 2012
- IEEE T-ED
Performance comparisons of III-V and strained-Si in planar FETs and nonplanar FinFETs at ultrashort gate length (12 nm)
- - Seung Hyun Park
  - Yang Liu
  - et al.
- 2012
- IEEE T-ED