The Defect Structure of ZnSe:Ga
- A. Ray
- F.A. Kröger
- 2019
- JES
Publications
14365 results for Physical Sciences
Ellipsometry Measurements of Polycrystalline Silicon Films
- E.A. Irene
- D.W. Dong
- 2019
- JES
Investigation of Laser-Enhanced Electroplating Mechanisms
- J. Cl. Puippe
- R.E. Acosta
- et al.
- 2019
- JES
Fabrication Processes for a Silicon Substrate Package for Integrated Gallium Arsenide Laser Arrays
- Michael J. Brady
- 2019
- JES
Interactions Between Cr and Pt Films: New Cr-Pt Phases
- J.E.E. Baglin
- F.M. d'Heurle
- et al.
- 2019
- JES
Parameter and Reactor Dependence of Selective Oxide RIE in CF4 + H2
- L.M. Ephroth
- E.J. Petrillo
- 2019
- JES
Preparation and Electrical Properties of V2O3 Single Crystals of Controlled Stoichiometry
- S.A. Shivashankar
- R. Aragón
- et al.
- 2019
- JES
On the Nature of Fixed Oxide Charge
- S.I. Raider
- A. Berman
- 2019
- JES
The Formation of SiO2 in an RF Generated Oxygen Plasma: II. The Pressure Range Above 10 mTorr
- A. Ray
- A. Reisman
- 2019
- JES
Control of Plasma Etch Profiles with Plasma Sheath Electric Field and RF Power Density
- R.S. Horwath
- 2019
- JES