Structural and surface potential characterization of annealed HfO 2 and (HfO 2) x(SiO 2) 1-x films
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- Journal of Applied Physics
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2360 results at Journal of Applied Physics
Small angle x-ray scattering metrology for sidewall angle and cross section of nanometer scale line gratings
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- Journal of Applied Physics
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- Journal of Applied Physics
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- Journal of Applied Physics
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- Journal of Applied Physics
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- Journal of Applied Physics
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- Journal of Applied Physics
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- Journal of Applied Physics
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- Journal of Applied Physics
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- Journal of Applied Physics
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