Discrete random dopant distribution effects in nanometer-scale MOSFETs
- Hon-Sum Philip Wong
- Yuan Taur
- et al.
- 1998
- Microelectronics Reliability
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Characterization of the hot-electron-induced degradation in thin SiO2 gate oxides
- E. Cartier
- 1998
- Microelectronics Reliability
A unified performance reliability analysis of a system with a cumulative down time constraint
- Victor Nicola
- Andrea Bobbio
- et al.
- 1992
- Microelectronics Reliability
Electromigration behavior of multilayered Al/Hf and Al/Ti fine lines and its dependence on Cu and Pd solute additions
- K.P. Rodbell
- 1992
- Microelectronics Reliability