Summary Abstract: Reactive ion-etching-related Si surface residues and subsurface disorder
- G.S. Oehrlein
- J.G. Clabes
- et al.
- 1986
- JVSTA
Publications
176 results at JVSTA
Thin films for magnetic recording technology: A review
- J.K. Howard
- 1986
- JVSTA
Surface processes leading to carbon contamination of photochemically deposited copper films
- F.A. Houle
- R.J. Wilson
- et al.
- 1986
- JVSTA
Reactive radio frequency sputter deposition of higher nitrides of titanium, zirconium, and hafnium
- D.S. Yee
- J.J. Cuomo
- et al.
- 1986
- JVSTA
Reactively sputter-deposited and coevaporated TeOx thin films for optical recording
- W.-Y. Lee
- F.O. Sequeda
- et al.
- 1986
- JVSTA
Effect of nucleation layers on the growth and magnetic properties of CoCr and CoCr-X films
- J.K. Howard
- 1986
- JVSTA
Thermal dry process soldering
- S.K. Ray
- H.L. Yeh
- 1986
- JVSTA
Time and angle resolved ultraviolet photoemission spectroscopy studies of single crystal surface and interfaces
- J. Bokor
- R.R. Freeman
- et al.
- 1986
- JVSTA
The atomic structure of the NiSi2~Si(111) interface
- E.J. van Loenen
- 1986
- JVSTA
A simplified scanning tunneling microscope for surface science studies
- J.E. Demuth
- R.J. Hamers
- et al.
- 1986
- JVSTA