Reciprocity between the reflection electron microscope and the low-loss scanning electron microscope
- Oliver C. Wells
- 2008
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Stress-relieved regrowth of silicon on sapphire by laser annealing
- G.A. Sai-Halasz
- F. Fang
- et al.
- 2008
- Applied Physics Letters
PaperPhase separation in alloy-Si interaction
- G. Ottaviani
- K.N. Tu
- et al.
- 2008
- Applied Physics Letters
PaperMeasurements of the rectifying barrier heights of various rhodium silicides with n-silicon
- J. De Sousa Pires
- F.M. D'Heurle
- et al.
- 2008
- Applied Physics Letters
PaperGlow discharge preparation of amorphous hydrogenated silicon from higher silanes
- B.A. Scott
- M.H. Brodsky
- et al.
- 2008
- Applied Physics Letters
PaperDetection of extended interstitial chains in ion-damaged silicon
- T.Y. Tan
- H. Föll
- et al.
- 2008
- Applied Physics Letters
PaperGeneration and measurement of ultrashort current pulses with Josephson devices
- Sadeg M. Faris
- 2008
- Applied Physics Letters
PaperCw monoenergetic Cs+ ion source by photoionization
- R.W. Dreyfus
- 2008
- Applied Physics Letters
PaperMagnetic field-induced semimetal-to-semiconductor transition in InAs-GaSb superlattices
- N. Kawai
- L.L. Chang
- et al.
- 2008
- Applied Physics Letters
PaperShallow silicide-to-silicon contacts: The case of amorphous-Pd 80Si20-to-silicon
- S. Kritzinger
- K.N. Tu
- 2008
- Applied Physics Letters
Paper