Attenuated total reflectance study of silicon-rich silicon dioxide films
- A. Hartstein
- D.J. Dimaria
- et al.
- 2008
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
Loop inductance of a Josephson junction interferometer
- W.H. Chang
- 2008
- Journal of Applied Physics
PaperMagnetocrystalline anisotropy in epitaxially grown (Gd,Tm,Y) 3(Fe,Ga)5O12 garnet thin films
- A. Gangulee
- R.J. Kobliska
- 2008
- Journal of Applied Physics
PaperGrain boundary diffusion of aluminum in polycrystalline silicon films
- J.C.M. Hwang
- P.S. Ho
- et al.
- 2008
- Journal of Applied Physics
PaperCharge trapping studies in SiO2 using high current injection from Si-rich SiO2 films
- D.J. DiMaria
- R. Ghez
- et al.
- 2008
- Journal of Applied Physics
PaperThe analysis of dislocations in strained III-V semiconductor crystals using elastobirefringence
- H. Booyens
- J.H. Basson
- 2008
- Journal of Applied Physics
PaperVariation of the ideality factor in the curent-voltage characteristics of double-heterostructure diodes
- E.S. Yang
- C.M. Wu
- et al.
- 2008
- Journal of Applied Physics
PaperComment on Correlation between process-induced in-plane distortion and wafer bowing in silicon
- Richard E. Gegenwarth
- 2008
- Journal of Applied Physics
ReviewTexture of NiSi films on Si(001), (111), and (110) substrates
- C. Detavernier
- J.L. Jordan-Sweet
- et al.
- 2008
- Journal of Applied Physics
PaperCrystallization properties of ultrathin phase change films
- Simone Raoux
- Jean L. Jordan-Sweet
- et al.
- 2008
- Journal of Applied Physics
Paper