Frame-Time Analysis of the Performance of Refreshed Matrix-Addressed Displays
- Paul M. Alt
- Peter Pleshko
- 1975
- IEEE T-ED
Paper
Publications
465 results at IEEE T-ED
In-Situ Measurement of Dielectric Thickness During Etching or Developing Processes
- Karl L. Konnerth
- Frederick H. Dill
- 1975
- IEEE T-ED
PaperElectrode Flatness Requirements for Cathode Projection Microfabrication Systems
- George A. Wardly
- 1975
- IEEE T-ED
PaperPerformance Characteristics of Electrochromic Displays
- Ifay F. Chang
- Webster E. Howard
- 1975
- IEEE T-ED
PaperModeling Projection Printing of Positive Photoresists
- James A. Tuttle
- Ed ward John Walker
- 1975
- IEEE T-ED
PaperV–1 Laser Fabrication of Large-Area Arrays: Thin-Film Silicon Isolated Devices on Fused Silica Substrates
- R.A. Laff
- G.L. Hutchins
- 1974
- IEEE T-ED
PaperScanning Limitations of Liquid-Crystal Displays
- Paul M. Alt
- Peter Pleshko
- 1974
- IEEE T-ED
PaperMachining Integrated Optical Structures in Photoresist
- F.H. Dill
- A.R. Neureuther
- 1973
- IEEE T-ED
PaperA Subnanosecond Josephson Tunneling Device Memory Cell
- H.H. Zappe
- 1973
- IEEE T-ED
PaperA Thin-Film Integrated Incandescent Display
- Frederick Hochberg
- Hugo K. Seitz
- et al.
- 1973
- IEEE T-ED
Paper