V-6 A Method for the Prevention of the Formation of Dark-Line and Dark-Spot Defects in GaAlAs Double Heterostructure LasersJ.A. Van VechtenJ.M. Blumet al.1976IEEE T-ED
Frame-Time Analysis of the Performance of Refreshed Matrix-Addressed DisplaysPaul M. AltPeter Pleshko1975IEEE T-ED
In-Situ Measurement of Dielectric Thickness During Etching or Developing ProcessesKarl L. KonnerthFrederick H. Dill1975IEEE T-ED