PaperModeling of luminescence phase delay for nondestructive characterization of Si wafersD. Guidotti, J.S. Batchelder, et al.Journal of Applied Physics
PaperSimple Theoretical Estimates of the Schottky Constants and Virtual-Enthalpies of Single Vacancy Formation in Zinc-Blende and Wurtzite Type SemiconductorsJ.A. Van VechtenJES
Conference paperEXTENDED AMORPHOUS VACANCIES. AN ALTERNATIVE TO THE SELF-INTERSTITIAL IN Si.J.A. Van VechtenICDS 1984
