Electron scattering in silicon inversion layers by oxide and surface roughness
- A. Hartstein
- T.H. Ning
- et al.
- 1976
- Surface Science
Paper
Publications
3555 results for Materials Discovery
Many-body effects in the first excited subband of the n-inversion layer of Si
- B. Vinter
- Frank Stern
- 1976
- Surface Science
PaperOxide-charge-induced impurity band in silicon inversion layers
- A. Hartstein
- A.B. Fowler
- 1976
- Surface Science
PaperScreening and level broadening in inversion layers with random fixed charges
- Frank Stern
- 1976
- Surface Science
PaperSome dynamical properties of a two-dimensional Wigner crystal
- Lynn Bonsall
- A.A. Maradudin
- 1976
- Surface Science
PaperCluster model calculation and photoemission studies of molecularly adsorbed NO on Ni
- I.P Batra
- C.R Brundle
- 1976
- Surface Science
PaperAuger study of preferred sputtering on binary alloy surfaces
- P.S Ho
- J.E Lewis
- et al.
- 1976
- Surface Science
PaperUse of misfit strain to remove dislocations from epitaxial thin films
- J.W. Matthews
- A.E. Blakeslee
- et al.
- 1976
- Thin Solid Films
PaperEffect of interdiffusion on the elasticity and internal friction of compositionally modulated copper-nickel thin films
- B.S. Berry
- W.C. Pritchet
- 1976
- Thin Solid Films
PaperAdhesion of copper films to aluminum oxide using a spinel structure interface
- Gerald Katz
- 1976
- Thin Solid Films
Paper