David B. Mitzi
Journal of Materials Chemistry
Paper
Oxide-charge-induced impurity band in silicon inversion layers
Abstract
No abstract available.
Related
Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
Eloisa Bentivegna
Big Data 2022
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001