Resonant tunneling via localized states in thin MOS structuresA. HartsteinR.H. Koch1986Surface Science
Surface diffusion of oxygen atoms individually observed by STMG. BinnigH. Fuchset al.1986Surface Science
Scanning tunneling microscopy of nanocrystalline silicon surfacesJ.K. GimzewskiA. Humbertet al.1986Surface Science
Early stages in the formation of the oxide-InP(110) interfaceG. HollingerG. Hugheset al.1986Surface Science
Inverse photoemission as a probe for unoccupied electronic statesF.J. HimpselD. Straub1986Surface Science
Si(111) surface oxidation: O 1s core-level study using synchrotron radiationG. HollingerJ.F. Moraret al.1986Surface Science
Schottky barrier, electronic states and microstructure at Ni silicide-silicon interfacesP.S. HoM. Liehret al.1986Surface Science