The negative bias temperature instability in MOS devices: A review
- J.H. Stathis
- S. Zafar
- 2006
- Microelectronics Reliability
Paper
Publications
44 results at Microelectronics Reliability
Considerations for evaluating hot-electron reliability of strained Si n-channel MOSFETs
- D.Q. Kelly
- S. Dey
- et al.
- 2005
- Microelectronics Reliability
PaperReverse short channel effects in high-k gated nMOSFETs
- J.-P. Han
- S.M. Koo
- et al.
- 2005
- Microelectronics Reliability
Conference paperTesting of ultra low voltage VLSI chips using the superconducting single-photon detector (SSPD)
- Franco Stellari
- Peilin Song
- 2004
- Microelectronics Reliability
Conference paperTime dependent dielectric breakdown in a low-k interlevel dielectric
- J.R. Lloyd
- E. Liniger
- et al.
- 2004
- Microelectronics Reliability
Conference paperCurrent crowding in faulty MOSFET: Optical and electrical investigation
- A. Tosi
- F. Stellari
- et al.
- 2004
- Microelectronics Reliability
Conference paperReliability challenges with ultra-low k interlevel dielectrics
- J.R. Lloyd
- M. Lane
- et al.
- 2004
- Microelectronics Reliability
Conference paperEffects of radiation and charge trapping on the reliability of high- κ gate dielectrics
- J.A. Felix
- J.R. Schwank
- et al.
- 2004
- Microelectronics Reliability
PaperReliability of ultra-thin oxides in CMOS circuits
- J.H. Stathis
- B.P. Linder
- et al.
- 2003
- Microelectronics Reliability
Conference paperInfluence and model of gate oxide breakdown on CMOS inverters
- R. Rodríguez
- J.H. Stathis
- et al.
- 2003
- Microelectronics Reliability
Conference paper