Mechanisms of contaminant particle production, migration, and adhesion
- R.J. Miller
- Douglas W. Cooper
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Publications
3556 results for Materials Discovery
Control of microstructure and properties of copper films using ion-assisted deposition
- R.A. Roy
- J.J. Cuomo
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperLinear and non-linear optical and spectroscopic properties of Langmuir-Blodgett films
- J.D. Swalen
- 1988
- Thin Solid Films
PaperSummary Abstract: Molecular-beam studies of dissociative chemisorption of O2on Pt(111)
- M.D. Williams
- D.S. Bethune
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperFourier transform Raman spectroscopy of thin films
- C.G. Zimba
- V.M. Hallmark
- et al.
- 1988
- Thin Solid Films
PaperCoevaporation of Cr-Cu and Mo-Ag
- J. Kim
- S.H. Wen
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperThin film adhesion: New possibilities for interface engineering
- J.E.E. Baglin
- 1988
- Materials Science and Engineering B
PaperNear-edge X-ray absorption fine structure studies of oriented molecular chains in polyethylene and Langmuir-Blodgett monolayers on Si(111)
- J. Rabe
- J.D. Swalen
- et al.
- 1988
- Thin Solid Films
PaperEffect of excess silicon on behavior of LPCVD WSix films on silicon
- R.V. Joshi
- Young H. Kim
- et al.
- 1988
- Thin Solid Films
PaperSize dependence of chemisorptive properties based on surface cluster models: CO/Cu(100) and CO/Al(100)
- K. Hermann
- P.S. Bagus
- 1988
- Applied Surface Science
Paper