Absolute depth profiling of thin film systems by low energy secondary neutral mass spectrometry
- A. Wucher
- H. Oechsner
- et al.
- 1989
- Thin Solid Films
Paper
Publications
3555 results for Materials Discovery
A study by scanning electron microscopy of magnetic head-tape interface sliding
- S.J. Calabrese
- B. Bhushan
- et al.
- 1989
- Wear
PaperThe angular dependence of preferential sputtering and composition in aluminum-copper thin films
- P. Rudeck
- J.M.E. Harper
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperBilayers with chromium disilicide: Chromium-vanadium
- T.G. Finstad
- O. Thomas
- et al.
- 1989
- Applied Surface Science
PaperThe determination of structure in small supported metal particles by scanning transmission electron diffraction
- H. Poppa
- R.D. Moorhead
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperHigh-rate reactive sputter deposition of aluminum oxide
- Fletcher Jones
- Joseph Logan
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperX-ray powder diffraction analysis of the electron superconductor Nd2-xThxCuO4 system
- T.C. Huang
- P.W. Wang
- et al.
- 1989
- Materials Research Bulletin
PaperDetermination of the local electronic structure of atomic-sized defects on Si(001) by tunneling spectroscopy
- R.J. Hamers
- U.K. Köhler
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperMechanical effects in peel adhesion test
- J. Kim
- K.S. Kim
- et al.
- 1989
- Journal of Adhesion Science and Technology
PaperEffect of oxygen on the electrical transport in RuO2
- L. Krusin-Elbaum
- 1989
- Thin Solid Films
Paper