Chemical characterization of surfaces and interfaces of industrial materials by X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry
- C.R. Brundle
- 1980
- Thin Solid Films
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The effects of oxygen and copper impurities on the structure of amorphous germanium
- J.F. Graczyk
- 1980
- Thin Solid Films
Electromigration in gold and copper thin film conductors
- R.J. Miller
- A. Gangulee
- 1980
- Thin Solid Films
The influence of ion sputtering on the elemental analysis of solid surfaces
- J.W. Coburn
- 1979
- Thin Solid Films
Intrinsic stress of magnetron-sputtered niobium films
- C.T. Wu
- 1979
- Thin Solid Films
Thermal strain in lead thin films IV: Effects of multiple cycling to 4.2 K
- M. Murakami
- J. Angelillo
- et al.
- 1979
- Thin Solid Films
Thermal strain in thin lead films III: Dependences of the strain on film thickness and on grain size
- Masanori Murakami
- 1979
- Thin Solid Films
A thin film metal base transistor structure with amorphous silicon
- A. Deneuville
- M.H. Brodsky
- 1978
- Thin Solid Films
Thermal strain in lead thin films II: strain relaxation mechanisms
- Masanori Murakami
- 1978
- Thin Solid Films
Recent advances in hydrogenated amorphous silicon
- M.H. Brodsky
- 1978
- Thin Solid Films