VA-6 Temperature-Dependent Properties of the Double HBJT
- S. Tiwari
- S.L. Wright
- et al.
- 1985
- IEEE T-ED
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A General Control-Volume Formulation for Modeling Impact Ionization in Semiconductor Transport
- Steven E. Laux
- Bertrand M. Grossman
- 1985
- IEEE T-ED
Performance Limits of CMOS ULSI
- James R. Pfiester
- John D. Shott
- et al.
- 1985
- IEEE T-ED
Correlation Between the Diffusive and Electrical Barrier Properties of the Interface in Polysilicon Contacted n+-p Junctions
- Johannes M.C. Stork
- Maurizio Arienzo
- et al.
- 1985
- IEEE T-ED
Correlations of Photoluminescence with Defect Densities in Semi-Insulating Gallium Arsenide
- Harold J. Hovel
- D. Guidotti
- 1985
- IEEE T-ED
Increasing the Current Driving Capability of Epitaxial Schottky-Barrier Diodes Using High-Energy Implantation
- C.T. Chuang
- G.P. Li
- et al.
- 1985
- IEEE T-ED
Stability and SER Analysis of Static RAM Cells
- Barbara Chappell
- Stanley E. Schustfr
- et al.
- 1985
- IEEE T-ED
Switch-On Transient of Shallow-Profile Bipolar Transistors
- Denny Duan-Lee Tang
- 1985
- IEEE T-ED
VA-5 Pseudomorphic GaInAs/GaAs Single Quantum Well High Electron Mobility Transistor
- J.J. Rosenberg
- M. Benlamri
- et al.
- 1985
- IEEE T-ED
An Analytical One-Dimensional Model for Lightly Doped Drain (LDD) MOSFET Devices
- Fang-Shi J. Lai
- Jack Yuan-Chen Sun
- 1985
- IEEE T-ED