Measurement of interface states in palladium silicon diodes
- Howard L. Evans
- Xu Wu
- et al.
- 1986
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
X-ray structures and magnetic properties of sputtered osmium-doped iron oxide thin films
- G. Lim
- T.C. Huang
- et al.
- 1986
- Journal of Applied Physics
PaperDoping reaction of PH3 and B2H6 with Si(100)
- Ming L. Yu
- D.J. Vitkavage
- et al.
- 1986
- Journal of Applied Physics
PaperFormation of intermediate phases, Ni3Si2 and Pt 6Si5: Nucleation, identification, and resistivity
- P. Gas
- F.M. D'Heurle
- et al.
- 1986
- Journal of Applied Physics
PaperInfrared thermal particle detection physics
- S. Utterback
- R.L. Melcher
- 1986
- Journal of Applied Physics
PaperElectrical conduction in polyimide films
- G.M. Sessler
- B. Hahn
- et al.
- 1986
- Journal of Applied Physics
PaperOxidation temperature dependence of the dc electrical conduction characteristics and dielectric strength of thin Ta2O5 films on silicon
- G.S. Oehrlein
- 1986
- Journal of Applied Physics
PaperEnergy band alignment in GaAs:(Al,Ga)As heterostructures: The dependence on alloy composition
- J. Batey
- S.L. Wright
- 1986
- Journal of Applied Physics
PaperInfluence of gas viscosity on the photoacoustic signal in gas-microphone cells
- P. Korpiun
- B. Büchner
- et al.
- 1986
- Journal of Applied Physics
PaperEffect of thermal and solution history on the Curie point of VF 2-TrFE random copolymers
- Jennifer S. Green
- Barry L. Farmer
- et al.
- 1986
- Journal of Applied Physics
Paper