Publications

19 results at Surface and Interface Analysis

Mechanism of silicon surface roughening by reactive ion etching
- - Gottlieb S. Oehrlein
  - Robert G. Schad
  - et al.
- 2004
- Surface and Interface Analysis
A possible solution to the problem of compositional change with ion‐bombarded oxides
- - Imre Bertóti
  - Roger Kelly
  - et al.
- 2004
- Surface and Interface Analysis
Voltage contrast XPS—a novel scheme for spatially resolved XPS studies
- - John J. Boland
- 2004
- Surface and Interface Analysis
Adhesion of copper and chromium films to polyimide studied by static SIMS of the interface
- - W.J. van Ooij
  - R.H.G. Brinkhuis
  - et al.
- 2004
- Surface and Interface Analysis
Investigation of gallium arsenide multilayer structures using a tunnelling microscope combined with a UHV‐SEM
- - O. Albrektsen
  - H. Salemink
- 2004
- Surface and Interface Analysis
On the role of Gibbsian segregation in causing preferential sputtering
- - Roger Kelly
- 2004
- Surface and Interface Analysis
ToF-SIMS studies of nanoporous PMSSQ materials: Kinetics and reactions in the processing of low-K dielectrics for ULSI applications
- - P. Lazzeri
  - G.W. Rubloff
  - et al.
- 2004
- Surface and Interface Analysis
Surface potential studies of self-assembling monolayers using Kelvin probe force microscopy
- - J. Lü
  - L. Eng
  - et al.
- 1999
- Surface and Interface Analysis
Conservative and dissipative interactions in dynamic force microscopy
- - U. Dürig
- 1999
- Surface and Interface Analysis