Measuring chromatic aberration in LEEM/PEEM
- Rudolf M. Tromp
- 2019
- Ultramicroscopy
Paper
Publications
128 results at Ultramicroscopy
Space charge effects and aberrations on electron pulse compression in a spherical electrostatic capacitor
- Lei Yu
- Haibo Li
- et al.
- 2017
- Ultramicroscopy
PaperDefocus in cathode lens instruments
- Rudolf M. Tromp
- M.S. Altman
- 2017
- Ultramicroscopy
PaperReprint of Low-energy electron potentiometry
- J. Jobst
- Jaap Kautz
- et al.
- 2017
- Ultramicroscopy
PaperLow-energy electron potentiometry
- J. Jobst
- Jaap Kautz
- et al.
- 2017
- Ultramicroscopy
PaperDesign and commissioning of an aberration-corrected ultrafast spin-polarized low energy electron microscope with multiple electron sources
- Weishi Wan
- Lei Yu
- et al.
- 2017
- Ultramicroscopy
PapereV-TEM: Transmission electron microscopy in a low energy cathode lens instrument
- Daniël Geelen
- A. Thete
- et al.
- 2015
- Ultramicroscopy
PaperAn adjustable electron achromat for cathode lens microscopy
- Rudolf M. Tromp
- 2015
- Ultramicroscopy
PaperCatadioptric aberration correction in cathode lens microscopy
- Rudolf M. Tromp
- 2015
- Ultramicroscopy
PaperInvestigation of multi-junction solar cells using electrostatic force microscopy methods
- M. Moczała
- Norma Sosa
- et al.
- 2014
- Ultramicroscopy
Paper