Faster IC analysis with PICA spatial temporal photon correlation and CAD autochanneling
- R. Desplats
- A. Eral
- et al.
- 2003
- Microelectronics Reliability
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44 results at Microelectronics Reliability
Analysis of the effect of the gate oxide breakdown on SRAM stability
- R. Rodríguez
- J.H. Stathis
- et al.
- 2002
- Microelectronics Reliability
Dependence of post-breakdown conduction on gate oxide thickness
- S. Lombardo
- J.H. Stathis
- et al.
- 2002
- Microelectronics Reliability
Optical diagnosis of excess IDDQ in low power CMOS circuits
- Franco Stellari
- Peilin Song
- et al.
- 2002
- Microelectronics Reliability
Mapping and statistical analysis of filaments locations in amorphous HfO2 ReRAM cells
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2023
- Microelectronics Reliability
Controversial issues in negative bias temperature instability
- James H. Stathis
- Souvik Mahapatra
- et al.
- 2018
- Microelectronics Reliability
Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges
- F. Chen
- Carole Graas
- et al.
- 2015
- Microelectronics Reliability
Long-term NBTI degradation under real-use conditions in IBM microprocessors
- Pong-Fei Lu
- Keith A. Jenkins
- et al.
- 2014
- Microelectronics Reliability
Electromigration challenges for advanced on-chip Cu interconnects
- Baozhen Li
- Cathryn Christiansen
- et al.
- 2014
- Microelectronics Reliability
On-chip circuit to monitor long-term NBTI and PBTI degradation
- Keith A. Jenkins
- Pong-Fei Lu
- 2013
- Microelectronics Reliability