Acceleration of dielectric charging in RF MEMS capacitive switches
- Xiaobin Yuan
- Zhen Peng
- et al.
- 2006
- IEEE T-DMR
Publications
19 results at IEEE T-DMR
Effect of Ge surface nitridation on the Ge/HfO2/Al MOS devices
- Reenu Garg
- Durga Misra
- et al.
- 2006
- IEEE T-DMR
Stress migration lifetime for Cu interconnects with CoWP-only cap
- Jeffrey P. Gambino
- Christy L. Johnson
- et al.
- 2006
- IEEE T-DMR
The energy-driven paradigm of NMOSFET hot-carrier effects
- Stewart E. Rauch Iii
- Giuseppe La Rosa
- 2005
- IEEE T-DMR
Electromigration and adhesion
- James R. Lloyd
- Michael W. Lane
- et al.
- 2005
- IEEE T-DMR
Threshold voltage instabilities in high-κ gate dielectric stacks
- Sufi Zafar
- Arvind Kumar
- et al.
- 2005
- IEEE T-DMR
Environmental effects on cracking and delamination of dielectric films
- Michael W. Lane
- Xia Hu Liu
- et al.
- 2004
- IEEE T-DMR
The statistics of NBTI-induced V T and β mismatch shifts in pMOSFETs
- Stewart E. Rauch III
- 2002
- IEEE T-DMR
Physical and predictive models of ultrathin oxide reliability in CMOS devices and circuits
- 2001
- IEEE T-DMR