Bias Temperature Instability model for digital circuits - Predicting instantaneous FET response
- Aditya Bansal
- Kai Zhao
- et al.
- 2011
- IRPS 2011
Publications
14 results at IRPS 2011
Spectral resolution of photon emission from SiGe:C heterojunction bipolar transistors (HBTs)
- Ulrike Kindereit
- Oana-Mihaela Mutihac
- et al.
- 2011
- IRPS 2011
Metastability of hydrogenated amorphous silicon passivation on crystalline silicon and implication to photovoltaic devices
- Bahman Hekmatshoar
- Davood Shahrjerdi
- et al.
- 2011
- IRPS 2011
Impact of source/drain contact and gate finger spacing on the RF reliability of 45-nm RF nMOSFETs
- Rajan Arora
- Sachin Seth
- et al.
- 2011
- IRPS 2011