The effect of power islands on delta-I noise, interconnect noise, and timing for wide, on-chip data-busesA. DeutschH. Smithet al.2005IEEE Topical Meeting EPEPS 2005
Comparison of time- and frequency domain measurement results for product related card and MCM transmission lines up to 65 GHzThomas-Michael WinkelA. Deutschet al.2005IEEE Topical Meeting EPEPS 2005