Scanning capacitance microscopy on a 25 nm scale
- C.C. Williams
- W.P. Hough
- et al.
- 1989
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Resolution of the nuclear and electronic contributions to the optical nonlinearity in polysilanes
- Daniel J. McGraw
- A.E. Siegman
- et al.
- 1989
- Applied Physics Letters
PaperSelective epitaxy in the conventional metalorganic vapor phase epitaxy of GaAs
- T.F. Kuech
- M.A. Tischler
- et al.
- 1989
- Applied Physics Letters
PaperUnpinned gallium oxide/GaAs interface by hydrogen and nitrogen surface plasma treatment
- A.C. Callegari
- P.D. Hoh
- et al.
- 1989
- Applied Physics Letters
PaperScanning tunneling microscopy of insulators: CaF2 epitaxy on Si (111)
- Ph. Avouris
- R.A. Wolkow
- 1989
- Applied Physics Letters
PaperLateral forces and topography using scanning tunneling microscopy with optical sensing of the tip position
- Marc A. Taubenblatt
- 1989
- Applied Physics Letters
PaperDopant redistribution during oxidation of SiGe
- F.K. LeGoues
- R. Rosenberg
- et al.
- 1989
- Applied Physics Letters
PaperDoppler profile measurement of Ar and Ar+ translational energies in a divergent magnetic field electron cyclotron resonance source
- John S. McKillop
- John C. Forster
- et al.
- 1989
- Applied Physics Letters
PaperGrowth temperature dependence of interfacial abruptness in Si/Ge heteroepitaxy studied by Raman spectroscopy and medium energy ion scattering
- Subramanian S. Iyer
- J.C. Tsang
- et al.
- 1989
- Applied Physics Letters
PaperNovel method of patterning YBaCuO superconducting thin films
- Q.Y. Ma
- E.S. Yang
- et al.
- 1989
- Applied Physics Letters
Paper