Ion Microbeam Probing of Sense Amplifiers to Analyze Single Event Upsets in a CMOS DRAM
- Linda M. Geppert
- David F. Heidel
- et al.
- 1991
- IEEE Journal of Solid-State Circuits
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Internal Node Probing of a DRAM with a Low-Temperature e-Beam Tester
- Keith A. Jenkins
- Walter H. Henkels
- 1991
- IEEE Journal of Solid-State Circuits
Performance Comparison of Driver Configurations and Full-Swing Techniques for BiCMOS Logic Circuits
- Hyun J. Shin
- 1990
- IEEE Journal of Solid-State Circuits
Level-Shifted 0.5-μm BiCMOS Circuits
- Chih-Liang Chen
- 1990
- IEEE Journal of Solid-State Circuits
Second-Generation RISC Floating Point with Multiply-Add Fused
- Erdem Hokenek
- Robert K. Montoye
- et al.
- 1990
- IEEE Journal of Solid-State Circuits
High-Frequency Phase-Locked Loops in Monolithic Bipolar Technology
- Mehmet Soyuer
- Robert G. Meyer
- 1989
- IEEE Journal of Solid-State Circuits
A 3.5-ns/77 K and 6.2-ns/300 K 64K CMOS RAM with ECL Interfaces
- Terry I. Chappell
- Stanley E. Schuster
- et al.
- 1989
- IEEE Journal of Solid-State Circuits
A 22-ns 1-Mbit CMOS High-Speed DRAM with Address Multiplexing
- Nicky C.C. Lu
- Gary B. Bronner
- et al.
- 1989
- IEEE Journal of Solid-State Circuits
A 23-ps/2.1-mW ECL Gate with an AC-Coupled Active Pull-Down Emitter-Follower Stage
- Kai-Yap Toh
- Ghing-Te Chuang
- et al.
- 1989
- IEEE Journal of Solid-State Circuits
A 250-Mbit/s Cmos Crosspoint Switch
- Hyun J. Shin
- David A. Hodges
- 1989
- IEEE Journal of Solid-State Circuits