High resolution 248 nm bilayer resist
- Q. Lin
- K.E. Petrillo
- et al.
- 1999
- SPIE Advances in Resist Technology and Processing 1999
Publications
3593 results for Mathematical Sciences
Molecular weight tailoring in methacrylate 193 nm photoresists
- Thomas I. Wallow
- P.J. Brock
- et al.
- 1999
- SPIE Advances in Resist Technology and Processing 1999
Aerial image contrast using interferometric lithography: Effect on line-edge roughness
- M.I. Sanchez
- W.D. Hinsberg
- et al.
- 1999
- SPIE Advances in Resist Technology and Processing 1999
Use of the Gibbs sampler to invert large, possibly sparse, positive definite matrices
- David A. Harville
- 1999
- Linear Algebra and Its Applications
Assessing the registration of CT-scan data to intra-operative X-rays by fusing X-rays and preoperative information
- A. Gueziec
- 1999
- Proceedings of SPIE - The International Society for Optical Engineering
3D visualization of the scoliotic spine: longitudinal studies, data acquisition, and radiation dosage constraints
- A.D. Kalvin
- R. Adler
- et al.
- 1999
- SPIE Medical Imaging 1999
Potential impact of laser illumination on light valve based projection displays
- Robert L. Melcher
- 1999
- SPIE-PHO-W 1999
Evolution of a high-quality digital imaging system
- Francis P. Giordano
- Gordon Braudaway
- et al.
- 1999
- Proceedings of SPIE - The International Society for Optical Engineering
Gallium nitride based LEDs on silicon substrates
- N.A. Bojarczuk
- S. Guha
- 1999
- Proceedings of SPIE - The International Society for Optical Engineering
Measurement and digital compensation of crosstalk and photoleakage in high-resolution TFTLCDs
- S.L. Wright
- Steven Millman
- et al.
- 1999
- Proceedings of SPIE - The International Society for Optical Engineering