Characterization of the structure of Langmuir-Blodgett films by short-wavelength radiations
- M. Pomerantz
- 1987
- Thin Solid Films
Paper
Publications
310 results at Thin Solid Films
Formation and oxidation mechanisms in two semiconducting silicides
- F.M d'Heurle
- 1987
- Thin Solid Films
PaperCharacterization of Ni-Cr thin films by X-ray analysis
- T.C. Huang
- J.K. Howard
- 1987
- Thin Solid Films
PaperLow temperature oxygen dissolution in titanium
- G. Ottaviani
- F. Nava
- et al.
- 1987
- Thin Solid Films
PaperPlasma-deposited fluorocarbon films on silicon studied by ellipsometry
- Gottlieb S. Oehrlein
- Ivar Reimanis
- et al.
- 1986
- Thin Solid Films
PaperContact for shallow junctions
- K.N. Tu
- 1986
- Thin Solid Films
PaperElectrical characterization of alloy thin films of VSi2 and V3Si
- F. Nava
- O. Bisi
- et al.
- 1986
- Thin Solid Films
PaperOxide characterization and behavior at CuCu and CuCuOx interfaces
- H. Lefakis
- P.S. Ho
- 1986
- Thin Solid Films
PaperThe formation of disilicides from bilayers of Ni/Co and Co/Ni on silicon: Phase separation and solid solution
- T.G. Finstad
- D.D. Anfiteatro
- et al.
- 1986
- Thin Solid Films
PaperThermally induced order-disorder transitions in Langmuir-Blodgett films
- C. Naselli
- J. Rabe
- et al.
- 1985
- Thin Solid Films
Paper