The edge versus path incidence matrix of series-parallel graphs and greedy packing
- Alan J. Hoffman
- Baruch Schieber
- 2001
- Discrete Applied Mathematics
Paper
Publications
3605 results for Mathematical Sciences
The L∞ Voronoi diagram of segments and VLSI applications
- Evanthia Papadopoulou
- D.T. Lee
- 2001
- International Journal of Computational Geometry and Applications
PaperA combination fingerprint classifier
- A.W. Senior
- 2001
- IEEE Transactions on Pattern Analysis and Machine Intelligence
PaperA high performance E-beam resist coupling excellent dry etch resistance and sub 100nm resolution for advanced mask making
- Wu-Song Huang
- Ranee Kwong
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
PaperExperimental approaches for assessing interfacial behavior of polymer films during dissolution in aqueous base
- William Hinsberg
- Seok-Won Lee
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
PaperSilicon-containing resists for 157 nm applications
- Ratnam Sooriyakumaran
- Debra Fenzel-Alexander
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
PaperIBM 193nm bilayer resist: Materials, lithographic performance and optimization
- Ranee Kwong
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- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
PaperHigh resolution patterning in chemically amplified resists: The effect of film thickness
- David R. Medeiros
- Wayne M. Moreau
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
PaperCharacterization of thin and ultrathin polymer and resist films
- Dario L. Goldfarb
- Qinhuang Lin
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
PaperPost-modification as a way to improve the lithographic performance of resist materials
- Wenjie Li
- P. Rao Varanasi
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
Paper