Optical dispersion relations for amorphous semiconductors and amorphous dielectricsA.R. ForouhiI. Bloomer1986Physical Review B
CaF2/Si(111): Thin-film characterization by high-resolution electron-energy-loss spectroscopyM. LiehrP.A. Thiryet al.1986Physical Review B
Orientational ordering induced by shear deformation in an amorphous Lennard-Jones solidL.T. ShiW. Krakow1986Physical Review B
Cyclotron-resonance oscillations in InAs quantum wellsD. HeitmanM. Ziesmannet al.1986Physical Review B
Activated dynamic scaling in spin glasses above the freezing temperatureA.P. MalozemoffE. Pytte1986Physical Review B
Electrical transport properties of V3Si, V5Si3, and VSi2 thin filmsF. NavaO. Bisiet al.1986Physical Review B
Microscopic probing of order-disorder versus displacive behavior in BaTiO3 by Fe3+ EPRK.A. MüllerW. Berlinger1986Physical Review B