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- IEEE Electron Device Letters
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- IEEE Electron Device Letters
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- IEEE Electron Device Letters
PaperGate length and performance scaling of undoped-body extremely thin SOI MOSFETs
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- IEEE Electron Device Letters
PaperDynamic resistance - A metric for variability characterization of phase-change memory
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- IEEE Electron Device Letters
PaperMobility scaling in short-channel length strained Ge-on-insulator P-MOSFETs
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- IEEE Electron Device Letters
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