ANOMALOUS MAGNETORESISTANCE IN SUB-0. 4 mu m NORMAL METAL RINGS.
- C.P. Umbach
- S. Washburn
- et al.
- 1983
- International Conference on Low Temperature Physics (LT) 1983
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138 results for Robert B. Laibowitz
AC conductivity analysis as a measure of low k dielectric capacitor reliability degradation due to moisture ingress
- Cyril Cabral
- Robert B. Laibowitz
- et al.
- 2020
- Microelectronic Engineering
Impedance spectroscopy studies of moisture uptake in low-k dielectrics and its relation to reliability
- A. Raja
- Robert B. Laibowitz
- et al.
- 2015
- Microelectronic Engineering
Detection of charge carrier confinement into mobile ionic defects in nanoporous dielectric films for advanced interconnects
- Juan Borja
- Joel L. Plawsky
- et al.
- 2014
- JVSTA
Probing the interface barriers of dopant-segregated silicide-Si diodes with internal photoemission
- Zhen Zhang
- Joanna Atkin
- et al.
- 2012
- IEEE T-ED
Base electrodes for high dielectric constant oxide materials in silicon technology
- A. Grill
- W. Kane
- et al.
- 2011
- Journal of Materials Research
The evolution of optical and electrical properties of low-k dielectrics under bias stress
- J.M. Atkin
- E. Cartier
- et al.
- 2009
- Microelectronic Engineering
Charge trapping at the low- k dielectric-silicon interface probed by the conductance and capacitance techniques
- J.M. Atkin
- E. Cartier
- et al.
- 2008
- Applied Physics Letters
Dependence of the Si-SiO2 barrier height on SiO2 thickness in MOS tunnel structures
- L. Kasprzak
- R.B. Laibowitz
- et al.
- 2008
- Journal of Applied Physics
Josephson effect in Nb nanobridges
- R.B. Laibowitz
- A.N. Broers
- et al.
- 2008
- Applied Physics Letters