Technique for determining concentration profiles of boron impurities in substrates
- J.F. Ziegler
- G.W. Cole
- et al.
- 2003
- Journal of Applied Physics
Paper
Publications
3 results for G.W. Cole
Discovery of anomalous base regions in transistors
- J.F. Ziegler
- G.W. Cole
- et al.
- 2003
- Applied Physics Letters
PaperBoron atom distributions in ion-implanted silicon by the (n,4He) nuclear reaction
- J.F. Ziegler
- B.L. Crowder
- et al.
- 2003
- Applied Physics Letters
Paper