Publications

22 results for Nicholas J. Mazzeo

Influence of NiFe quality on bubble devices
- - M.S. Cohen
  - G.W. Beall
  - et al.
- 2008
- Journal of Applied Physics
Abstract: Magnetic properties and domain structures in narrow NiFe stripes
- - M.H. Kryder
  - K.Y. Ahn
  - et al.
- 2008
- Journal of Applied Physics
A room temperature 0.1 μm CMOS on SOI
- - G. Shahidi
  - C. Blair
  - et al.
- 1993
- VLSI Technology 1993
Elecromigration damage in fine Al alloy lines due to interfacial diffusion
- - C.-K. Hu
  - M.B. Small
  - et al.
- 1993
- MRS Proceedings 1993
Electromigration in two-level bamboo grain structure Al(Cu)/W interconnections
- - C.-K. Hu
  - N.J. Mazzeo
  - et al.
- 1993
- Materials Chemistry and Physics
A 5Gb/s 16×16 Si-bipolar crosspoint switch
- - Hyun Shin
  - James Warnock
  - et al.
- 1992
- ISSCC 1992
A Scaled 0.25- μm Bipolar Technology Using Full e-Beam Lithography
- - John D. Cressler
  - James Warnock
  - et al.
- 1992
- IEEE Electron Device Letters
Reactive ion etching of Nb/A1O_x/Nb for Josephson technology
- - C.-K. Hu
  - N.J. Mazzeo
  - et al.
- 1991
- Thin Solid Films
A full E-beam 0.25 mu m bipolar technology with sub-25 ps ECL gate delay
- - J. Warnock
  - J.D. Cressler
  - et al.
- 1991
- IEDM 1991
A 0.5 μm fully scaled two-level metal fully planarized interconnect structure fabricated with X-ray lithography
- - D. Moy
  - L.K. Wang
  - et al.
- 1990
- VLSI Technology 1990