Structure of thin lead oxide layers as determined by x-ray diffraction
- T.B. Light
- J.M. Eldridge
- et al.
- 2008
- Journal of Applied Physics
Publications
8 results for T.B. Light
Accommodation of misfit across the interface between crystals of semiconducting elements or compounds
- J.W. Matthews
- S. Mader
- et al.
- 2003
- Journal of Applied Physics
Precision thermal expansion measurements of semi-insulating GaAs
- R. Feder
- T.B. Light
- 2003
- Journal of Applied Physics
A determination of the thermal expansion of pure Ge and a measurement of the differential thermal expansion of a GeSingle Bond signGaAs thin-layer couple
- R. Feder
- T.B. Light
- 2003
- Journal of Applied Physics
Preferred orientation in bias-sputtered nickel chromium films
- E. Stern
- T.B. Light
- 2003
- Applied Physics Letters
Thermal forming of niobium oxide switchable resistors
- K.C. Park
- M. Berkenblit
- et al.
- 1973
- Journal of Electronic Materials
Anomalous Thermal Behavior of Boron-Doped Low-Temperature Ge Epitaxial Layers
- M. Berkenblit
- T.B. Light
- et al.
- 1970
- JES
Density of "amorphous" Ge
- T.B. Light
- 1969
- Physical Review Letters