Diffusion of Ion-Implanted Arsenic in Thermally Grown SiO2Films
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11 results for P. Balk
Polarization of thin phosphosilicate glass films in MGOS structures
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PaperStrain relaxation in GeSi layers with uniform and graded composition
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Conference paperStrain relaxation in GeSi layers with uniform and graded composition
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PaperSummary Abstract: High temperature decomposition of SiO2at the Si/SiO2 interface
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PaperHigh-temperature SiO2 decomposition at the SiO2/Si interface
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PaperSurface Properties of Oxidized Germanium-Doped Silicon
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PaperCharge Injection in MAOS Systems
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PaperPhosphosilicate Glass Stabilization of FET Devices
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PaperOrientation Dependence of Built-in Surface Charge on Thermally Oxidized Silicon
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