Sampling oscilloscope for millimicrosecond pulses at a 30-Mc repetition rateArnold S. Farber2004Review of Scientific InstrumentsPaper
Wide-Band Network Characterization by Fourier Transformation of Time-Domain MeasurementsA.S. FarberC.W. Ho1969IEEE JSSCPaper
Picosecond Integrated Circuits in Germanium and SiliconF.H. DillArnold S. Farberet al.1968IEEE JSSCPaper
Measuring the Delay of Sub-Nanosecond CircuitsA.S. FarberJ.J. Decillo1967Proceedings of the IEEEPaper
Transient Analysis of a Transmission-Line Tunnel-Diode CircuitA.G. FrancoA.S. Farber1963Proceedings of the IEEEPaper