Publications

5 results for Mark R. Friendlich

32 and 45 nm radiation-hardened-by-design (RHBD) SOI latches
- - Kenneth P. Rodbell
  - David F. Heidel
  - et al.
- 2011
- IEEE TNS
Heavy ion testing with iron at 1 GeV/amu
- - Jonathan A. Pellish
  - Michael A. Xapsos
  - et al.
- 2010
- IEEE TNS
Single-event upsets and multiple-bit upsets on a 45 nm SOI SRAM
- - David F. Heidel
  - Paul W. Marshall
  - et al.
- 2009
- IEEE TNS
Heavy ion testing at the galactic cosmic ray energy peak
- - Jonathan A. Pellish
  - Michael A. Xapsos
  - et al.
- 2009
- RADECS 2009
Low energy proton single-event-upset test results on 65 nm SOI SRAM
- - David F. Heidel
  - Paul W. Marshall
  - et al.
- 2008
- IEEE TNS