Predictive full circuit ESD simulation and analysis using extended ESD compact models: Methodology and tool implementation
- Junjun Li
- Robert Gauthier
- et al.
- 2010
- EOS/ESD 2010
Conference paper
Publications
10 results for Mujahid Muhammad
Failure analysis of I/O with ESD protection devices in advanced CMOS technologies
- Mujahid Muhammad
- Robert Gauthier
- et al.
- 2007
- IPFA 2007
Conference paperPMOSFET-based ESD protection in 65nm bulk CMOS technology for improved external latchup robustness
- Junjun Li
- Robert Gauthier
- et al.
- 2005
- EOS/ESD 2005
Conference paperI/O interface latchup analysis using optical and electrical testing
- Franco Stellari
- Peilin Song
- et al.
- 2004
- Electronic Device Failure Analysis
PaperModel-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- K. Chatty
- P.E. Cottrell
- et al.
- 2004
- IRPS 2004
Conference paperModel-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- K. Chatty
- P.E. Cottrell
- et al.
- 2004
- IRPS 2004
Conference paperOptical and Electrical Testing of Latchup in I/O Interface Circuits
- Franco Stellari
- Peilin Song
- et al.
- 2003
- IEEE ITC 2003
Conference paperStudy of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- ISTFA 2003
Conference paperLatchup Analysis Using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- Microelectronics Reliability
Conference paperElectrostatic discharge induced oxide breakdown characterization in a 0.1 μm CMOS technology
- A. Salman
- R. Gauthier
- et al.
- 2002
- IRPS 2002
Conference paper