Heavy ion testing with iron at 1 GeV/amu
- Jonathan A. Pellish
- Michael A. Xapsos
- et al.
- 2010
- IEEE TNS
Paper
Publications
126 results for Ken Rodbell
Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2010
- IEEE TNS
PaperModeling of alpha-induced single event upsets for 45 nm node SOI devices using realistic C4 and 3D circuit geometries
- Henry H. K. Tang
- Conal E. Murray
- et al.
- 2009
- IEEE TNS
PaperSingle-event upsets and multiple-bit upsets on a 45 nm SOI SRAM
- David F. Heidel
- Paul W. Marshall
- et al.
- 2009
- IEEE TNS
PaperFlip-flop upsets from single-event-transients in 65 nm clock circuits
- Larry Wissel
- David F. Heidel
- et al.
- 2009
- IEEE TNS
PaperAn evaluation of an ultralow background alpha-particle detector
- Michael S. Gordon
- David F. Heidel
- et al.
- 2009
- IEEE TNS
PaperEstimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2009
- RADECS 2009
Conference paperTechnologies to further reduce soft error susceptibility in SOI
- P. Oldiges
- R.H. Dennard
- et al.
- 2009
- IEDM 2009
Conference paperHeavy ion testing at the galactic cosmic ray energy peak
- Jonathan A. Pellish
- Michael A. Xapsos
- et al.
- 2009
- RADECS 2009
Conference paperAlpha-particle, carbon-ion and proton- induced flip-flop single-event-upsets in 65 nm bulk technology
- Larry Wissel
- Ethan H. Cannon
- et al.
- 2008
- IEEE TNS
Paper